KS C IEC 60749-4-2020
Semiconductor devices — Mechanical and climatic test methods — Part 4: Damp heat, steady state,highly accelerated stress test(HAST)

Standard No.

KS C IEC 60749-4-2020

Release Date

2020

Published By

KR-KS

Latest

KS C IEC 60749-4-2020

KS C IEC 60749-4-2020 history

• 2020 KS C IEC 60749-4:2020 Semiconductor devices — Mechanical and climatic test methods — Part 4: Damp heat, steady state,highly accelerated stress test(HAST)
• 2003 KS C IEC 60749-4:2003 Semiconductor devices－Mechanical and climatic test methods－Part 4：Damp heat, steady state, highly accelerated stress test(HAST)