T/IAWBS 011-2019
Test methods for measuring resistivity of conductive silicon carbide wafers with a noncontact eddy-current gauge (English Version)
- Standard No.
- T/IAWBS 011-2019
- Language
- Chinese, Available in English version
- Release Date
- 2019
- Published By
- Group Standards of the People's Republic of China
- Latest
- T/IAWBS 011-2019
T/IAWBS 011-2019 history
- 2019 T/IAWBS 011-2019 Test methods for measuring resistivity of conductive silicon carbide wafers with a noncontact eddy-current gauge
