IEC 63275-2:2022
Semiconductor devices - Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors - Part 2: Test method for bipolar degradation due to body diode operatio

Standard No.

IEC 63275-2:2022

Release Date

2022

Published By

International Electrotechnical Commission (IEC)

Latest

IEC 63275-2:2022

IEC 63275-2:2022 history

• 2022 IEC 63275-2:2022 Semiconductor devices - Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors - Part 2: Test method for bipolar degradation due to body diode operatio