IEC 60749-43:2017
Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 43: Lignes directrices concernant les plans de qualification de la fiabilité des CI (Edition 1.0)
- Standard No.
- IEC 60749-43:2017
- Release Date
- 2017
- Published By
- IEC - International Electrotechnical Commission
- Latest
- IEC 60749-43:2017
- Scope
- This part of IEC 60749 gives guidelines for reliability qualification plans of semiconductor integrated circuit products (ICs). This document is not intended for military- and space-related applications. NOTE 1 The manufacturer can use flexible sample sizes to reduce cost and maintain reasonable reliability by this guideline adaptation based on EDR-4708@ AEC Q100@ JESD47 or other relevant document can also be applicable if it is specified. NOTE 2 The Weibull distribution method used in this document is one of several methods to calculate the appropriate sample size and test conditions of a given reliability project.
IEC 60749-43:2017 history
- 2017 IEC 60749-43:2017 Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 43: Lignes directrices concernant les plans de qualification de la fiabilité des CI (Edition 1.0)
