BS EN 60749-4:2017
Semiconductor devices. Mechanical and climatic test methods - Damp heat, steady state, highly accelerated stress test (HAST)
- Standard No.
- BS EN 60749-4:2017
- Release Date
- 2017
- Published By
- British Standards Institution (BSI)
- Latest
- BS EN 60749-4:2017
- Scope
- What is BS EN IEC 60749-4 - Damp heat, steady-state, HAST of semiconductor devices about? BS EN IEC 60749 is an international standard covering damp hear, steady-state, HAST of semiconductor devices, ensuring stable operability, and longevity in semiconductor applications . BS EN IEC 60749 provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of the non-hermetic packaged semiconductor devices in humid environments. Who is BS EN 60749-4 - Damp heat, steady-state, HAST of semiconductor devices for?
BS EN 60749-4:2017 history
- 2018 BS EN IEC 60749-12:2018 Semiconductor devices. Mechanical and climatic test methods. Vibration, variable frequency
- 2002 BS EN 60749-12:2002 Semiconductor devices - Mechanical and climatic test methods - Vibration, variable frequency
- 1999 BS EN 60749:1999 Semiconductor devices - Mechanical and climatic test methods
- 0000 BS 6493-3:1986
