DIN EN IEC 60749-30 E:2019-09
Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
- Standard No.
- DIN EN IEC 60749-30 E:2019-09
- Release Date
- 1970
- Published By
- /
- Status
- Replace By
- DIN EN IEC 60749-30:2023-02
- Latest
- DIN EN IEC 60749-30:2023-02
DIN EN IEC 60749-30 E:2019-09 history
- 2023 DIN EN IEC 60749-30:2023-02 Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing (IEC 60749-30:2020); German version EN IEC 60749-30:2020 / Note: DIN EN 60749-30 (2011-12) remain...
- 1970 DIN EN IEC 60749-30 E:2019-09 Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
