UNE-EN 60749-30:2005
Semiconductor devices - Mechanical and climatic test methods -- Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing

Standard No.

UNE-EN 60749-30:2005

Release Date

2005

Published By

AENOR

Status

Be replaced 2011-12

Replace By

UNE-EN 60749-30:2005/A1:2011

Latest

UNE-EN 60749-30:2005/A1:2011

UNE-EN 60749-30:2005 history

• 2011 UNE-EN 60749-30:2005/A1:2011 Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
• 2005 UNE-EN 60749-30:2005 Semiconductor devices - Mechanical and climatic test methods -- Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing