BS EN IEC 63287-2:2023
Semiconductor devices. Guidelines for reliability qualification plans Concept of mission profile (British Standard)
- Standard No.
- BS EN IEC 63287-2:2023
- Published By
- American National Standards Institute （ANSI)
- Latest
- BS EN IEC 63287-2:2023
- Scope
- This part of IEC 63287 gives guidelines for the development of reliability qualification plans using the concept of mission profile, based on the environmental conditioning and proposed usage of the product. This document is not intended for military- and space-related applications.
BS EN IEC 63287-2:2023 Referenced Document
- IEC 63287-1:2021 Semiconductor devices - Generic semiconductor qualification guidelines - Part 1: Guidelines for IC reliability qualification*， 2021-08-01 Update
BS EN IEC 63287-2:2023 history
- 1970 BS EN IEC 63287-2:2023 Semiconductor devices. Guidelines for reliability qualification plans Concept of mission profile (British Standard)
