UNE-EN IEC 60749-28:2022
Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level (Endorsed by Asociación Española de Normalización in May of 2022.)

Standard No.

UNE-EN IEC 60749-28:2022

Release Date

2022

Published By

ES-UNE

Latest

UNE-EN IEC 60749-28:2022

UNE-EN IEC 60749-28:2022 history

• 2022 UNE-EN IEC 60749-28:2022 Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level (Endorsed by Asociación Española de Normalización in May of 2022.)