1.1 This calorimetric test method covers the determination of total hemispherical emittance of metal and graphite surfaces and coated metal surfaces up to approximately 1400°C. The upper-use temperature is limited only by the characteristics (for example, melting temperature, vapor pressure) of the specimen and the design limits of the test facility. This test method has been demonstrated for use up to 1400 °C. The lower-use temperature is limited by the temperature of the bell jar.
1.2 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.
1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use. For specific hazard statements, see Section 7.
1.4 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.
ASTM C835-06(2020) Referenced Document
ASTM C168 Standard Terminology Relating to Thermal Insulation*, 2022-05-01 Update
ASTM E230 Standard Specification and Temperature-Electromotive Force (EMF) Tables for Standardized Thermocouples
ASTM E691 Standard Practice for Conducting an Interlaboratory Study to Determine the Precision of a Test Method
ASTM C835-06(2020) history
2020ASTM C835-06(2020) Standard Test Method for Total Hemispherical Emittance of Surfaces up to 1400°C
2006ASTM C835-06(2013)e1 Standard Test Method for Total Hemispherical Emittance of Surfaces up to 1400deg;C
2006ASTM C835-06 Standard Test Method for Total Hemispherical Emittance of Surfaces up to 1400176;C
2001ASTM C835-01(2006) Standard Test Method for Total Hemispherical Emittance of Surfaces up to 1400176C
2001ASTM C835-01 Standard Test Method for Total Hemispherical Emittance of Surfaces up to 1400176C
2001ASTM C835-00 Standard Test Method for Total Hemispherical Emittance of Surfaces up to 1400°C