T/IAWBS 013-2019
The measurement method of resistivity for semi-insulating silicon carbide substrate (English Version)

Standard No.
T/IAWBS 013-2019
Language
Chinese, Available in English version
Release Date
2019
Published By
Group Standards of the People's Republic of China
Latest
T/IAWBS 013-2019

T/IAWBS 013-2019 history

  • 2019 T/IAWBS 013-2019 The measurement method of resistivity for semi-insulating silicon carbide substrate
The measurement method of resistivity for semi-insulating silicon carbide substrate



Copyright ©2023 All Rights Reserved