BS ISO 11938:2012
Microbeam analysis. Electron probe microanalysis. Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
- Standard No.
- BS ISO 11938:2012
- Release Date
- 2013
- Published By
- British Standards Institution (BSI)
- Status
- 2013-04
- Replace By
- BS ISO 11938:2013
- Latest
- BS ISO 11938:2013
- Scope
- 1 Scope This International Standard provides procedures for electron microprobe elemental-mapping analysis using wavelength-dispersive spectrometry. The choice between mapping with the electron beam moving digitally across the specimen (electron beam mapping) and mapping with stage movement only (large-area mapping) is assessed. It describes five types of data processing: the raw X-ray intensity data method, the k-value method, the calibration method, the correlation method and the matrix correction method.
BS ISO 11938:2012 history
- 2013 BS ISO 11938:2013 Microbeam analysis. Electron probe microanalysis. Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
- 2013 BS ISO 11938:2012 Microbeam analysis. Electron probe microanalysis. Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
