BS EN 60749-3:2017
Semiconductor devices. Mechanical and climatic test methods - External visual examination
- Standard No.
- BS EN 60749-3:2017
- Release Date
- 2017
- Published By
- British Standards Institution (BSI)
- Latest
- BS EN 60749-3:2017
- Scope
- What is BS EN IEC 60749-3 - External visual examination of semiconductor devices about? BS EN IEC 60749 is an international standard covering external visual examination of semiconductor devices that facilitates testing, classification and applicability of semiconductor devices. The purpose of BS EN IEC 60749 is to verify that the materials, design, construction, markings, and workmanship of a semiconductor device are in accordance with the applicable procurement document. In BS EN IEC 60749 , is an external visual inspection is a non-destructive test and is applicable for all package types. The test is useful for q...
BS EN 60749-3:2017 history
- 2018 BS EN IEC 60749-12:2018 Semiconductor devices. Mechanical and climatic test methods. Vibration, variable frequency
- 2002 BS EN 60749-12:2002 Semiconductor devices - Mechanical and climatic test methods - Vibration, variable frequency
- 1999 BS EN 60749:1999 Semiconductor devices - Mechanical and climatic test methods
- 0000 BS 6493-3:1986
