BS EN IEC 60749-17:2019
Semiconductor devices. Mechanical and climatic test methods. Neutron irradiation
- Standard No.
- BS EN IEC 60749-17:2019
- Release Date
- 2019
- Published By
- British Standards Institution (BSI)
- Latest
- BS EN IEC 60749-17:2019
- Scope
- What is BS EN IEC 60749 ‑ 17 about? BS EN IEC 60749 ‑ 17 is the 17th part of an international standard that covers the attributes of semiconductor devices. This specifies the neutron irradiation test method for determining the degradation parameters of critical semiconductor devices. BS EN IEC 60749 ‑ 17 specifies the neutron irradiation test is performed to determine the susceptibility of semiconductor devices to non-ionizing energy loss (NIEL) degradation. It gives technical specifications such as related terms and definitions, test apparatus, test procedure, safety requirements, etc.
BS EN IEC 60749-17:2019 history
- 2019 BS EN IEC 60749-17:2019 Semiconductor devices. Mechanical and climatic test methods. Neutron irradiation
