DS/ENV 1071-1:1993 Advanced technical ceramics. Methods of test for ceramic coatings. Part 1: Determination of coating thickness by contact probe profilometer
This Part of ENV 1071 describes a method for the determination of the thickness of ceramic coatings by measurement of the step height using a contact probe profilometer.
NOTE : An alternative measurement of thickness, using a cap grinding method, is described in ENV 1071-2
DS/ENV 1071-1:1993 history
1993DS/ENV 1071-1:1993 Advanced technical ceramics. Methods of test for ceramic coatings. Part 1: Determination of coating thickness by contact probe profilometer