KS C IEC 60749-32:2021 Semiconductor devices — Mechanical and climatic test methods — Part 32: Flammability of plastic-encapsulated devices(externally induced)
2021KS C IEC 60749-32:2021 Semiconductor devices — Mechanical and climatic test methods — Part 32: Flammability of plastic-encapsulated devices(externally induced)
0000 KS C IEC 60749-32-2006(2016)
2006KS C IEC 60749-32:2006 Semiconductor devices-Mechanical and climatic test methods-Part 32:Flammability of plastic-encapsulated devices(externally induced)