KS C IEC PAS 62162-2002(2022)
Field－induced charged－device model test method for electrostatic discharge withstand thresholds of microelectronic components

Standard No.

KS C IEC PAS 62162-2002(2022)

Release Date

2002

Published By

Korean Agency for Technology and Standards (KATS)

Status

Withdraw

Latest

KS C IEC PAS 62162-2002(2022)

KS C IEC PAS 62162-2002(2022) history

• 0000 KS C IEC PAS 62162-2002(2022)
• 0000 KS C IEC PAS 62162-2002(2017)
• 2002 KS C IEC PAS 62162:2002 Field－induced charged－device model test method for electrostatic discharge withstand thresholds of microelectronic components