KS C IEC 60749-19-2020
Semiconductor devices — Mechanical and climatic test methods — Part 19: Die shear strength

Standard No.

KS C IEC 60749-19-2020

Release Date

2020

Published By

KR-KS

Latest

KS C IEC 60749-19-2020

KS C IEC 60749-19-2020 history

• 2020 KS C IEC 60749-19:2020 Semiconductor devices — Mechanical and climatic test methods — Part 19: Die shear strength
• 2005 KS C IEC 60749-19:2005 Semiconductor devices－Mechanical and climatic test methods－Part 19：Die shear strength