UNE-EN 60749-2:2003
Semiconductor devices - Mechanical and climatic test methods -- Part 2: Low air pressure.

Standard No.

UNE-EN 60749-2:2003

Release Date

2003

Published By

AENOR

Latest

UNE-EN 60749-2:2003

UNE-EN 60749-2:2003 history

• 2003 UNE-EN 60749-2:2003 Semiconductor devices - Mechanical and climatic test methods -- Part 2: Low air pressure.