BS EN IEC 63287-1:2021
Semiconductor devices. Generic semiconductor qualification guidelines - Guidelines for IC reliability qualification
- Standard No.
- BS EN IEC 63287-1:2021
- Release Date
- 2021
- Published By
- British Standards Institution (BSI)
- Latest
- BS EN IEC 63287-1:2021
- Scope
- 1 Scope This part of IEC 63287 gives guidelines for reliability qualification plans of semiconductor integrated circuit products. This document is not intended for military- and space-related applications. NOTE 1 The manufacturer can use flexible sample sizes to reduce cost and maintain reasonable reliability by this guideline adaptation based on EDR-4708, AEC Q100, JESD47 or other relevant document can also be applicable if it is specified. NOTE 2 The Weibull distribution method used in this document is one of several methods to calculate the appropriate sample size and test conditions of a given reliability project.
BS EN IEC 63287-1:2021 history
- 2021 BS EN IEC 63287-1:2021 Semiconductor devices. Generic semiconductor qualification guidelines - Guidelines for IC reliability qualification
