KS C IEC 60749-11-2020
Semiconductor devices — Mechanical and climatic test methods —Part 11: Rapid change of temperature — Two-fluid-bath method

Standard No.

KS C IEC 60749-11-2020

Release Date

2020

Published By

KR-KS

Latest

KS C IEC 60749-11-2020

KS C IEC 60749-11-2020 history

• 2020 KS C IEC 60749-11:2020 Semiconductor devices — Mechanical and climatic test methods —Part 11: Rapid change of temperature — Two-fluid-bath method
• 2002 KS C IEC 60749-11:2002 Semiconductor devices－Mechanical and climatic test methods－Part 11：Rapid change of temperature－Two－fluid－bath method