UNE-EN 60749-4:2003
Semiconductor devices - Mechanical and climatic test methods -- Part 4: Damp heat, steady state, highly accelerated stress test (HAST).

Standard No.

UNE-EN 60749-4:2003

Release Date

2003

Published By

AENOR

Status

Be replaced

Replace By

UNE-EN 60749-4:2017

Latest

UNE-EN 60749-4:2017

UNE-EN 60749-4:2003 history

• 2017 UNE-EN 60749-4:2017 Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST) (Endorsed by Asociación Española de Normalización in July of 2017.)
• 2003 UNE-EN 60749-4:2003 Semiconductor devices - Mechanical and climatic test methods -- Part 4: Damp heat, steady state, highly accelerated stress test (HAST).