T/CIE 151-2022
Dynamic aging test method for field programmable gate array (FPGA) chips (English Version)

Standard No.

T/CIE 151-2022

Language

Chinese, Available in English version

Published By

Group Standards of the People's Republic of China

Latest

T/CIE 151-2022

T/CIE 151-2022 history

• 1970 T/CIE 151-2022 Dynamic aging test method for field programmable gate array (FPGA) chips