GB/T 37049-2018
Test method for the content of metal impurity in electronic grade polysilicon—Inductively coupled-plasma mass spectrometry method (English Version)

Standard No.

GB/T 37049-2018

Language

Chinese, Available in English version

Release Date

2018

Published By

国家市场监督管理总局、中国国家标准化管理委员会

Latest

GB/T 37049-2018

GB/T 37049-2018 history

• 2018 GB/T 37049-2018 Test method for the content of metal impurity in electronic grade polysilicon—Inductively coupled-plasma mass spectrometry method