ANSI/IEEE Std 759-1984
IEEE Standard Test Procedures for Semiconductor X-Ray Energy Spectrometers

Standard No.

ANSI/IEEE Std 759-1984

Release Date

1984

Published By

Institute of Electrical and Electronics Engineers (IEEE)

Latest

ANSI/IEEE Std 759-1984

Scope

Test procedures for X-ray spectrometers consisting of a semiconductor radiation detector assembly and signal processing electronics interfaced to a pulse-height analyzer/computer are presented. Energy resolution, spectral distortion, pulse-height linearity, counting rate effects, overload effects, pulse-height stability, and efficiency are covered. Test procedures for pulse-height analyzers and co...

ANSI/IEEE Std 759-1984 history

• 1984 ANSI/IEEE Std 759-1984 IEEE Standard Test Procedures for Semiconductor X-Ray Energy Spectrometers