T/IAWBS 018-2022
Test method for dislocation density of diamond single crystal polished wafers (English Version)

Standard No.
T/IAWBS 018-2022
Language
Chinese, Available in English version
Release Date
2022
Published By
Group Standards of the People's Republic of China
Latest
T/IAWBS 018-2022
Scope
Based on the material performance characteristics of diamond single crystal, and combined with the current research level of dislocation density detection technology of other single crystals such as sapphire at home and abroad, this standard provides the testing principle, measurement accuracy guarantee, and measurement steps for the dislocation density of diamond single crystal polished wafers. etc. have been stipulated.

T/IAWBS 018-2022 history

  • 2022 T/IAWBS 018-2022 Test method for dislocation density of diamond single crystal polished wafers



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