DB32/T 4378-2022
Four-probe method for non-destructive testing of sheet resistance of nanometer and submicron scale thin films on substrate surface (English Version)
- Standard No.
- DB32/T 4378-2022
- Language
- Chinese, Available in English version
- Release Date
- 2022
- Published By
- Jiangsu Provincial Standard of the People's Republic of China
- Latest
- DB32/T 4378-2022
DB32/T 4378-2022 history
- 2022 DB32/T 4378-2022 Four-probe method for non-destructive testing of sheet resistance of nanometer and submicron scale thin films on substrate surface
