ASTM E2444-11(2018) PDF

Scope: 1.1 This standard consists of terms and definitions pertaining to measurements taken on thin, reflecting films, such as found in microelectromechanical systems (MEMS) materials. In particular, the terms are related to the standards in Section 2, which were generated by Committee E08 on Fatigue and Fracture. Terminology E1823 Relating to Fatigue and Fracture Testing is applicable to this standard. 1.2 The terms are listed in alphabetical order. 1.3 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

ASTM E2444-11(2018) Referenced Document

ASTM E1823 Standard Terminology Relating to Fatigue and Fracture Testing
ASTM E2244 Standard Test Method for In-Plane Length Measurements of Thin, Reflecting Films Using an Optical Interferometer*， 2024-04-21 Update
ASTM E2245 Standard Test Method for Residual Strain Measurements of Thin, Reflecting Films Using an Optical Interferometer*， 2024-04-21 Update
ASTM E2246 Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer*， 2024-04-21 Update

2018 ASTM E2444-11(2018) Standard Terminology Relating to Measurements Taken on Thin, Reflecting Films
2011 ASTM E2444-11e1 Terminology Relating to Measurements Taken on Thin, Reflecting Films
2011 ASTM E2444-11 Terminology Relating to Measurements Taken on Thin, Reflecting Films
2005 ASTM E2444-05e1 Terminology Relating to Measurements Taken on Thin, Reflecting Films
2005 ASTM E2444-05 Terminology Relating to Measurements Taken on Thin, Reflecting Films