T/ZAQ 10113-2022
Intermittent working life test equipment for semiconductor devices (English Version)

Standard No.

T/ZAQ 10113-2022

Language

Chinese, Available in English version

Release Date

2022

Published By

Group Standards of the People's Republic of China

Latest

T/ZAQ 10113-2022

Scope

This document specifies the terms and definitions, basic parameters, technical requirements, test methods, inspection rules, signs, instructions for use, packaging, transportation and storage of semiconductor device intermittent working life test equipment (hereinafter referred to as life test equipment).

T/ZAQ 10113-2022 history

• 2022 T/ZAQ 10113-2022 Intermittent working life test equipment for semiconductor devices