BS EN IEC 60749-41:2020
Semiconductor devices. Mechanical and climatic test methods. Standard reliability testing methods of non-volatile memory devices
- Standard No.
- BS EN IEC 60749-41:2020
- Release Date
- 2020
- Published By
- British Standards Institution (BSI)
- Latest
- BS EN IEC 60749-41:2020
BS EN IEC 60749-41:2020 history
- 2020 BS EN IEC 60749-41:2020 Semiconductor devices. Mechanical and climatic test methods. Standard reliability testing methods of non-volatile memory devices
