This part of EN 12698 describes the methods for the analysis of all refractory products containing nitride bonded silicon carbide@ irrespective of the Silicon carbide level. It includes details of sample preparation@ general principles of chemical analysis and detailed methods for the determination of carbon@ silicon carbide@ free aluminium@ free silicon@ total nitrogen and oxygen. Silicon nitride@ silicon oxynitride@ silicon@ free silica and silicon aluminium oxynitride (sialon) can be determined by XRD.
PREN 12698-2005 history
2007EN 12698-2:2007 Chemical analysis of nitride bonded silicon carbide refractories - Part 2: XRD methods
2005PREN 12698-2005 Chemical analysis of nitride bonded silicon carbide refractories