DB61/T 1448-2021
Intermittent life test procedures for high-power semiconductor discrete devices (English Version)
- Standard No.
- DB61/T 1448-2021
- Language
- Chinese, Available in English version
- Release Date
- 2021
- Published By
- Shaanxi Provincial Standard of the People's Republic of China
- Latest
- DB61/T 1448-2021
- Scope
- This document specifies the terms and definitions, test systems, test procedures, failure criteria and test report requirements for intermittent life testing of high-power semiconductor discrete devices (hereinafter referred to as devices). This document is suitable for intermittent life tests of semiconductor discrete devices such as high-power bipolar transistors, field effect transistors, insulated gate field effect transistors, and diodes.
DB61/T 1448-2021 history
- 2021 DB61/T 1448-2021 Intermittent life test procedures for high-power semiconductor discrete devices
