UNE-EN 62047-18:2013
Semiconductor devices - Micro-electromechanical devices - Part 18: Bend testing methods of thin film materials (Endorsed by AENOR in November of 2013.)

Standard No.

UNE-EN 62047-18:2013

Release Date

2013

Published By

ES-UNE

Latest

UNE-EN 62047-18:2013

UNE-EN 62047-18:2013 history

• 2013 UNE-EN 62047-18:2013 Semiconductor devices - Micro-electromechanical devices - Part 18: Bend testing methods of thin film materials (Endorsed by AENOR in November of 2013.)