T/CSTM 00780.3-2023 Methods for chemical analysis of sodium vanadate—Part 3: Determination of silicon，aluminum，etc. 12 impurity elements content —Inductively coupled plasma (English Version)
This document specifies the principles, reagents and samples for the determination of silicon, aluminum, calcium, iron, lead, manganese, chromium, titanium, arsenic, molybdenum, copper and phosphorus in sodium vanadate using inductively coupled plasma atomic emission spectrometry. Instruments and equipment, samples, test procedures, calculation of analytical results, precision and test reports. This document is applicable to the determination of the content of silicon, aluminum, calcium, iron, lead, manganese, chromium, titanium, arsenic, molybdenum, copper, phosphorus and other impurity elements in sodium vanadate and its solution. The measurement range is shown in Table 1. If the content of any element exceeds the upper limit of the determination range, please refer to this document.
T/CSTM 00780.3-2023 history
2023T/CSTM 00780.3-2023 Methods for chemical analysis of sodium vanadate—Part 3: Determination of silicon，aluminum，etc. 12 impurity elements content —Inductively coupled plasma