SJ/T 31129-1994
Requirements of readiness and methods of inspection and assessment for high/low temperature test equipment (English Version)

Standard No.

SJ/T 31129-1994

Language

Chinese, Available in English version

Published By

Professional Standard - Electron

Latest

SJ/T 31129-1994

Scope

This standard specifies the integrity requirements and inspection and evaluation methods for high and low temperature testing equipment. This standard applies to DCP-55 digital display high and low temperature testing equipment. Other similar types of high and low temperature testing devices can also be implemented with reference to the relevant provisions of this standard.

SJ/T 31129-1994 history

• 1970 SJ/T 31129-1994 Requirements of readiness and methods of inspection and assessment for high/low temperature test equipment