SJ 3205-1989
Test methods for evaporation rate of electronic materials (English Version)

Standard No.

SJ 3205-1989

Language

Chinese, Available in English version

Release Date

1989

Published By

Professional Standard - Electron

Latest

SJ 3205-1989

Scope

1.1 This standard specifies the use of quartz crystal monitor method to determine the evaporation rate of electronic materials. 1.2 This standard applies to all solid electronic materials.

SJ 3205-1989 history

• 1989 SJ 3205-1989 Test methods for evaporation rate of electronic materials