SJ 3196-1989
Test methods for transmitting coefficient of secondary electron of electronic materials (English Version)

Standard No.

SJ 3196-1989

Language

Chinese, Available in English version

Release Date

1989

Published By

Professional Standard - Electron

Latest

SJ 3196-1989

Scope

1.1 This standard specifies the determination of the secondary electron emission coefficient of electronic materials using the electron gun method. 1.2 This standard applies to all solid electronic materials (including metals, non-metals, semiconductors and insulators).

SJ 3196-1989 history

• 1989 SJ 3196-1989 Test methods for transmitting coefficient of secondary electron of electronic materials