SJ 2214.6-1982
Method of measurement for collector-emitter reverse breakdown voltage of semiconductor phototransistors (English Version)
- Standard No.
- SJ 2214.6-1982
- Language
- Chinese, Available in English version
- Release Date
- 1982
- Published By
- Professional Standard - Electron
- Status
- 2015-10
- Replace By
- SJ/T 2214-2015
- Latest
- SJ/T 2214-2015
SJ 2214.6-1982 history
- 2015 SJ/T 2214-2015 Measuring methods for semiconductor photodiode and phototransistor
- 1982 SJ 2214.6-1982 Method of measurement for collector-emitter reverse breakdown voltage of semiconductor phototransistors
SJ 2214.6-1982 Method of measurement for collector-emitter reverse breakdown voltage of semiconductor phototransistors was changed to SJ/T 2214-2015 Measuring methods for semiconductor photodiode and phototransistor.
