This standard is applicable to the general principles for emission spectrum analysis methods of semiconductor materials such as germanium, silicon, gallium arsenide, indium phosphide and indium antimonide. Its contents include basic principles, instruments, standard solution preparation, sample processing methods, and spectral conditions. Selection, and general provisions related thereto.
SJ/Z 3206.13-1989 history
1989SJ/Z 3206.13-1989 General rules for emision spectrum analysis for semiconductor materials