SJ 1551-1979
Method of measurement for resistivity of silicon epitaxial layer (capacitance-voltage method) (Provisional) (English Version)
- Standard No.
- SJ 1551-1979
- Language
- Chinese, Available in English version
- Release Date
- 1980
- Published By
- Professional Standard - Electron
- Status
- 2010-02
- Latest
- SJ 1551-1979
SJ 1551-1979 history
- 1980 SJ 1551-1979 Method of measurement for resistivity of silicon epitaxial layer (capacitance-voltage method) (Provisional)
