SJ/T 11210-1999
Measurement of quartz crystal unit parameters.Part4:Method for the measurement of the load resonance frequency fL,load resonance resistance RL and the calculation of other derived values of quartz crystal units,up to 30MHz (English Version)
- Standard No.
- SJ/T 11210-1999
- Language
- Chinese, Available in English version
- Release Date
- 1999
- Published By
- Professional Standard - Electron
- Latest
- SJ/T 11210-1999
- Scope
- This standard specifies a simple measurement method for the load resonant frequency f|(L) and load resonant resistance R|(L) of quartz crystal components with frequencies up to 30MHz. From these two measurements, the load resonant frequency offset ΔF|(L), the frequency pull range Δf|(L|(1)L|(2)) and the pull sensitivity defined by IEC122-1 Modification 1 can be calculated S.
SJ/T 11210-1999 history
- 1999 SJ/T 11210-1999 Measurement of quartz crystal unit parameters.Part4:Method for the measurement of the load resonance frequency fL,load resonance resistance RL and the calculation of other derived values of quartz crystal units,up to 30MHz
