SJ/T 10805-2000
Semiconductor integrated circuits.General principles of measuring methods for voltage comparators (English Version)

Standard No.

SJ/T 10805-2000

Language

Chinese, Available in English version

Release Date

2000

Published By

Professional Standard - Electron

Status

Be replaced 2018-04

Replace By

SJ/T 10805-2018

Latest

SJ/T 10805-2018

Replace

GB/T 6798-1986

Scope

This specification specifies the basic principles of electrical characteristics testing methods for semiconductor integrated circuit voltage comparators. This specification is applicable to the testing of electrical characteristics of voltage comparators of semiconductor integrated circuits.

SJ/T 10805-2000 history

• 2018 SJ/T 10805-2018 Semiconductor integrated circuit voltage comparator test method
• 2000 SJ/T 10805-2000 Semiconductor integrated circuits.General principles of measuring methods for voltage comparators
• 1970 SJ/T 10805-1996 Semiconductor integrated circuits used as interface circuits--General principles of measuring methods of voltage comparators