SJ 20744-1999
General rule of infrared absorption spectral analysis for the impurity concentration in semiconductor materials (English Version)
- Standard No.
- SJ 20744-1999
- Language
- Chinese, Available in English version
- Release Date
- 1999
- Published By
- Professional Standard - Electron
- Latest
- SJ 20744-1999
- Scope
- This standard specifies the terminology, basic principles, instrumentation and equipment, sample preparation, measurement conditions, measurement procedures and calculation of measurement results for infrared absorption analysis methods of impurity content in semiconductor materials. This standard is applicable to the infrared analysis method of any semiconductor single crystal material that is transparent in the infrared spectral region and produces impurity absorption bands in this region.
SJ 20744-1999 history
- 1999 SJ 20744-1999 General rule of infrared absorption spectral analysis for the impurity concentration in semiconductor materials
