SJ 20858-2002
Measuring methods for electrical parameters of silicon carbide single crystal material (English Version)
- Standard No.
- SJ 20858-2002
- Language
- Chinese, Available in English version
- Release Date
- 2002
- Published By
- Professional Standard - Electron
- Latest
- SJ 20858-2002
SJ 20858-2002 history
- 2002 SJ 20858-2002 Measuring methods for electrical parameters of silicon carbide single crystal material
