SJ 3249.1-1989 Methods of measurement for resistivity of semi-insulation Gallium arsenide and Indium phosphide single crystal material (English Version)
This standard specifies the measurement quantities, instruments and equipment, measurement procedures, and calculation methods for the resistivity of semi-insulating gallium arsenide and indium phosphide body single crystal materials. This standard is applicable to single-piece semi-insulating materials of gallium arsenide and indium phosphide with a uniform room temperature resistivity of 10^(6)~10^(8)Ω·cm and a resistivity of 10^(4)~10^( 5) Ω·cm can also be used as a reference.
SJ 3249.1-1989 history
1989SJ 3249.1-1989 Methods of measurement for resistivity of semi-insulation Gallium arsenide and Indium phosphide single crystal material