SJ 3249.1-1989
Methods of measurement for resistivity of semi-insulation Gallium arsenide and Indium phosphide single crystal material (English Version)

Standard No.
SJ 3249.1-1989
Language
Chinese, Available in English version
Release Date
1989
Published By
Professional Standard - Electron
Status
 2010-02
Latest
SJ 3249.1-1989
Scope
This standard specifies the measurement quantities, instruments and equipment, measurement procedures, and calculation methods for the resistivity of semi-insulating gallium arsenide and indium phosphide body single crystal materials. This standard is applicable to single-piece semi-insulating materials of gallium arsenide and indium phosphide with a uniform room temperature resistivity of 10^(6)~10^(8)Ω·cm and a resistivity of 10^(4)~10^( 5) Ω·cm can also be used as a reference.

SJ 3249.1-1989 history

  • 1989 SJ 3249.1-1989 Methods of measurement for resistivity of semi-insulation Gallium arsenide and Indium phosphide single crystal material
Methods of measurement for resistivity of semi-insulation Gallium arsenide and Indium phosphide single crystal material



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