IEC 60749-44:2016
Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices
- Standard No.
- IEC 60749-44:2016
- Release Date
- 2016
- Published By
- International Electrotechnical Commission (IEC)
- Latest
- IEC 60749-44:2016
IEC 60749-44:2016 history
- 2016 IEC 60749-44:2016 Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices
