ISO 21222:2020
Surface chemical analysis — Scanning probe microscopy — Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
- Standard No.
- ISO 21222:2020
- Release Date
- 2020
- Published By
- International Organization for Standardization (ISO)
- Latest
- ISO 21222:2020
- Scope
- This document describes a procedure for the determination of elastic modulus for compliant materials using atomic force microscope (AFM). Force-distance curves on the surface of compliant materials are measured and the analysis uses a two-point method based on Johnson-Kendall-Roberts (JKR) theory. This document is applicable to compliant materials with elastic moduli ranging from 100 kPa to 1 GPa. The spatial resolution is dependent on the contact radius between the AFM probe and the surface and is typically approximately10-20 nm.
ISO 21222:2020 Referenced Document
- ISO 11775 Surface chemical analysis - Scanning-probe microscopy - Determination of cantilever normal spring constants
- ISO 18115-2 Surface chemical analysis — Vocabulary — Part 2: Terms used in scanning-probe microscopy*， 2021-12-21 Update
ISO 21222:2020 history
- 2020 ISO 21222:2020 Surface chemical analysis — Scanning probe microscopy — Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
