HB 6742-1993
Determination of Crystal Orientation of Single Crystal Blades by X-ray Backblow Laue Photography (English Version)
- Standard No.
- HB 6742-1993
- Language
- Chinese, Available in English version
- Release Date
- 1993
- Published By
- Professional Standard - Aviation
- Latest
- HB 6742-1993
- Scope
- This standard specifies the general requirements for the method principles, instruments and equipment, angle measurement, diffraction pattern analysis and orientation calibration using X-ray back-reflection Laue photography to detect the orientation of metal crystals. This standard is applicable to the detection of crystal orientation of cast nickel-based high-temperature alloy directionally solidified single crystal and columnar crystal blades and specimens. For example, it is suitable for DD series single crystals and DZ series columnar crystals, and is also suitable for the orientation determination of grains with a diameter larger than 1mm. Orientation determination of other metal crystals can also be used as a reference.
HB 6742-1993 history
- 1993 HB 6742-1993 Determination of Crystal Orientation of Single Crystal Blades by X-ray Backblow Laue Photography
