T/NXCL 017-2022
300 mm heavily phosphorus-doped single crystaline Czochralski silicon polished wafers (English Version)

Standard No.

T/NXCL 017-2022

Language

Chinese, Available in English version

Release Date

2022

Published By

Group Standards of the People's Republic of China

Latest

T/NXCL 017-2022

T/NXCL 017-2022 history

• 2022 T/NXCL 017-2022 300 mm heavily phosphorus-doped single crystaline Czochralski silicon polished wafers