SJ 2355.4-1983
Methods of measurement for junction capacitance of light-emitting devices (English Version)
- Standard No.
- SJ 2355.4-1983
- Language
- Chinese, Available in English version
- Release Date
- 1983
- Published By
- Professional Standard - Electron
- Status
- 2010-01
- Replace By
- SJ/T 11394-2009
- Latest
- SJ/T 11394-2009
SJ 2355.4-1983 history
- 2009 SJ/T 11394-2009 Measure methods of semiconductor light emitting diodes
- 1983 SJ 2355.4-1983 Methods of measurement for junction capacitance of light-emitting devices
SJ 2355.4-1983 Methods of measurement for junction capacitance of light-emitting devices was changed to SJ/T 11394-2009 Measure methods of semiconductor light emitting diodes.
